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ISHIKAWA Yasuaki
Department Aoyama Gakuin University Department of Electrical Engineering and Electronics, College of Science and Engineering Position Professor |
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| Language | English |
| Publication Date | 2019/05 |
| Type | Academic Journal |
| Peer Review | Peer reviewed |
| Invitation | Invited paper |
| Title | Degradation phenomenon in metal oxide semiconductor thin film transistors and techniques for its reliability evaluation and suppression |
| Contribution Type | Collaboration |
| Journal | Jpn. J. Appl. Phys. |
| Journal Type | Another Country |
| Volume, Issue, Page | 58,pp.090502-1-10 |
| Author and coauthor | Yukiharu Uraoka, Juan Paolo Bermundo, Mami Fujii, Mutsunori Uenuma, and Yasuaki Ishikawa |
| DOI | 10.7567/1347-4065/ab1604 |