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ISHIKAWA Yasuaki
Department Aoyama Gakuin University Department of Electrical Engineering and Electronics, College of Science and Engineering Position Professor |
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| Language | English |
| Publication Date | 2019/12 |
| Type | Academic Journal |
| Peer Review | Peer reviewed |
| Title | Evaluate Fixed Charge and Oxide Trapped Charge on SiO2/GaN MOS Structure Before and After Post Annealing |
| Contribution Type | Collaboration |
| Journal | Physica Status Solidi B |
| Journal Type | Another Country |
| Volume, Issue, Page | 257,pp.1900444-1-6 |
| Author and coauthor | Masaaki Furukawa, Mutsunori Uenuma, Yasuaki Ishikawa, and Yukiharu Uraoka |
| DOI | 10.1002/pssb.201900444 |