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ISHIKAWA Yasuaki
Department Aoyama Gakuin University Department of Electrical Engineering and Electronics, College of Science and Engineering Position Professor |
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| Language | English |
| Publication Date | 2020/12 |
| Type | Academic Journal |
| Peer Review | Peer reviewed |
| Title | Recover possibilities of potential induced degradation caused by the micro-cracked locations in p-type crystalline silicon solar cells |
| Contribution Type | Collaboration |
| Journal | Prog. Photovolt. |
| Journal Type | Another Country |
| Volume, Issue, Page | 29,pp.423-432 |
| Author and coauthor | Dong Chung Nguyen, Yasuaki Ishikawa, and Yukiharu Uraoka |
| DOI | 10.1002/pip.3383 |