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ISHIKAWA Yasuaki
Department Aoyama Gakuin University Department of Electrical Engineering and Electronics, College of Science and Engineering Position Professor |
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| Language | English |
| Publication Date | 2013/12 |
| Type | Academic Journal |
| Peer Review | Peer reviewed |
| Title | The influence of fluorinated silicon nitride gate insulator on positive bias stability toward highly reliable amorphous InGaZnO thin-film transistors |
| Contribution Type | Collaboration |
| Journal | ECS J. Solid State Sci. Technol. |
| Journal Type | Another Country |
| Volume, Issue, Page | 3(2),pp.Q20-Q23 |
| Author and coauthor | Haruka Yamazaki, Yasuaki Ishikawa, Mami Fujii, Yoshihiro Ueoka, Masaki Fujiwara, Eiji Takahashi, Yasunori Andoh, and Yukiharu Uraoka |
| DOI | 10.1149/2.014402jss |