ISHIKAWA Yasuaki
Department Aoyama Gakuin University Department of Electrical Engineering and Electronics, College of Science and Engineering Position Professor |
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Language | English |
Publication Date | 2013/02 |
Type | Academic Journal |
Peer Review | Peer reviewed |
Title | Thermal analysis of amorphous oxide thin-film transistor degraded by combination of joule heating and hot carrier effect |
Contribution Type | Collaboration |
Journal | Appl. Phys. Lett. |
Journal Type | Another Country |
Volume, Issue, Page | 102(5),pp.53506-1-4 |
Author and coauthor | Satoshi Urakawa, Shigekazu Tomai, Yoshihiro Ueoka, Haruka Yamazaki, Masashi Kasami, Koki Yano, Dapeng Wang, Mamoru Furuta, Masahiro Horita, Yasuaki Ishikawa, Yukiharu Uraoka |
DOI | 10.1063/1.4790619 |